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electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM)
No reflective coating
-110V) but available as a spare part
Magnetic Force Microscopy Sample
DSCMSCH Critical Dimension (Overhang) electrically conductive tip that isSCM cantilever holder for Dimension series SPMs DESCRIPTION This SCM cantilever holder supports the Scanning Capacitance Microscopy (SCM) application module for Dimension BioScope SPMs. The integrated piezo can be actuated for TappingMode or LiftMode operation. The holder comes with a short cable for connection to the SCM application module.
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